Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9097442 | Made to elements capable of collecting light | Hans-Werner Kuster, Franz Karg, Walter Stetter, Joerg Baumbach | 2015-08-04 |
| 8140902 | Internally controlling and enhancing advanced test and characterization in a multiple core microprocessor | Michael Stephen Floyd, Norman K. James | 2012-03-20 |
| 8122312 | Internally controlling and enhancing logic built-in self test in a multiple core microprocessor | Michael Stephen Floyd, Joshua D. Friedrich, Norman K. James | 2012-02-21 |
| 7934135 | Providing pseudo-randomized static values during LBIST transition tests | Phillip G. Williams | 2011-04-26 |
| 7908532 | Automated system and processing for expedient diagnosis of broken shift registers latch chains | Joseph Eckelman, Donato O. Forlenza, Orazio P. Forlenza, Phong T. Tran | 2011-03-15 |
| 7886244 | Driving values to DC adjusted/untimed nets to identify timing problems | Yee Ja, Christoph Jaeschke | 2011-02-08 |
| 7873890 | Techniques for performing a Logic Built-In Self-Test in an integrated circuit device | Abel Alaniz, Asher Shlomo Lazarus, Timothy M. Skergen | 2011-01-18 |
| 7856582 | Techniques for logic built-in self-test diagnostics of integrated circuit devices | Daniel W. Cervantes, Joshua P. Hernandez, Timothy M. Skergan | 2010-12-21 |
| 7490305 | Method for driving values to DC adjusted/untimed nets to identify timing problems | Yee Ja, Christoph Jaeschke | 2009-02-10 |
| 7234088 | Method and apparatus for generating signal transitions used for testing an electronic device | — | 2007-06-19 |
| 6920625 | Method and apparatus for optimum transparent latch placement in a macro design | — | 2005-07-19 |
| 6909358 | Hamming distance comparison | — | 2005-06-21 |