| 9097442 |
Made to elements capable of collecting light |
Hans-Werner Kuster, Franz Karg, Walter Stetter, Joerg Baumbach |
2015-08-04 |
| 8140902 |
Internally controlling and enhancing advanced test and characterization in a multiple core microprocessor |
Michael Stephen Floyd, Norman K. James |
2012-03-20 |
| 8122312 |
Internally controlling and enhancing logic built-in self test in a multiple core microprocessor |
Michael Stephen Floyd, Joshua D. Friedrich, Norman K. James |
2012-02-21 |
| 7934135 |
Providing pseudo-randomized static values during LBIST transition tests |
Phillip G. Williams |
2011-04-26 |
| 7908532 |
Automated system and processing for expedient diagnosis of broken shift registers latch chains |
Joseph Eckelman, Donato O. Forlenza, Orazio P. Forlenza, Phong T. Tran |
2011-03-15 |
| 7886244 |
Driving values to DC adjusted/untimed nets to identify timing problems |
Yee Ja, Christoph Jaeschke |
2011-02-08 |
| 7873890 |
Techniques for performing a Logic Built-In Self-Test in an integrated circuit device |
Abel Alaniz, Asher Shlomo Lazarus, Timothy M. Skergen |
2011-01-18 |
| 7856582 |
Techniques for logic built-in self-test diagnostics of integrated circuit devices |
Daniel W. Cervantes, Joshua P. Hernandez, Timothy M. Skergan |
2010-12-21 |
| 7490305 |
Method for driving values to DC adjusted/untimed nets to identify timing problems |
Yee Ja, Christoph Jaeschke |
2009-02-10 |
| 7234088 |
Method and apparatus for generating signal transitions used for testing an electronic device |
— |
2007-06-19 |
| 6920625 |
Method and apparatus for optimum transparent latch placement in a macro design |
— |
2005-07-19 |
| 6909358 |
Hamming distance comparison |
— |
2005-06-21 |
