Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8214170 | Test pattern compression | Patrick R. Crosby, Johnny LeBlanc, Samuel I. Ward | 2012-07-03 |
| 7856582 | Techniques for logic built-in self-test diagnostics of integrated circuit devices | Robert B. Gass, Joshua P. Hernandez, Timothy M. Skergan | 2010-12-21 |
| 7519889 | System and method to reduce LBIST manufacturing test time of integrated circuits | Joshua P. Hernandez, Tung Nguyen Pham, Timothy M. Skergan | 2009-04-14 |