Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8214170 | Test pattern compression | Daniel W. Cervantes, Johnny LeBlanc, Samuel I. Ward | 2012-07-03 |
| 8006152 | Scan chain fail diagnostics | Samuel I. Ward, William Ramsour, Bao G. Truong | 2011-08-23 |
PC
Patrick R. Crosby
Overall (All Time): #2,092,957 of 4,157,543Top 55%
2
Patents All Time