Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7225374 | ABIST-assisted detection of scan chain defects | Todd Burdine, Donato O. Forlenza, Orazio P. Forlenza, William J. Hurley, Steven Michnowski | 2007-05-29 |
| 7171564 | Universal password generation method | Edward E. Kelley, Franco Motika | 2007-01-30 |