Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10768230 | Built-in device testing of integrated circuits | Mary P. Kusko, Gary W. Maier, Franco Motika, Phong T. Tran | 2020-09-08 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10768230 | Built-in device testing of integrated circuits | Mary P. Kusko, Gary W. Maier, Franco Motika, Phong T. Tran | 2020-09-08 |