Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7993504 | Backside unlayering of MOSFET devices for electrical and physical characterization | Terence L. Kane, John D. Sylvestri, Michael P. Tenney | 2011-08-09 |
| 7961307 | Angular spectrum tailoring in solid immersion microscopy for circuit analysis | Stephen Bradley Ippolito, Peilin Song, John D. Sylvestri | 2011-06-14 |
| 7826045 | Angular spectrum tailoring in solid immersion microscopy for circuit analysis | Stephen Bradley Ippolito, Peilin Song, John D. Sylvestri | 2010-11-02 |
| 7371689 | Backside unlayering of MOSFET devices for electrical and physical characterization | Terence L. Kane, John D. Sylvestri, Michael P. Tenney | 2008-05-13 |
| 7112983 | Apparatus and method for single die backside probing of semiconductor devices | Patrick J. McGinnis, Richard W. Oldrey, John D. Sylvestri, Manuel J. Villalobos | 2006-09-26 |
| 7015146 | Method of processing backside unlayering of MOSFET devices for electrical and physical characterization including a collimated ion plasma | Terence L. Kane, John D. Sylyestri, Michael P. Tenney | 2006-03-21 |
| 6894522 | Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devices | Barbara A. Averill, Terence L. Kane, Richard W. Oldrey, John D. Sylvestri | 2005-05-17 |
| 6852629 | Backside integrated circuit die surface finishing technique and tool | Terence L. Kane | 2005-02-08 |
| 6790125 | Backside integrated circuit die surface finishing technique and tool | Terence L. Kane | 2004-09-14 |