Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7063987 | Backside failure analysis of integrated circuits | Walter J. Rowe, Jr., Isaiah McDonald | 2006-06-20 |
| 6703641 | Structure for detecting charging effects in device processing | Terence L. Kane, Yun-Yu Wang, Michael P. Tenney | 2004-03-09 |