Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated circuit test optimization using adaptive test pattern sampling algorithm

Integrated circuit test optimization using adaptive test pattern sampling algorithm

US Patent 8689066 · Granted Apr 1, 2014

Estimated economic value: $5,095,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods for increasing a retention force between a polymeric scaffold and a deli2023
Customized cosmetic compositions, and methods of rejuvenating and utilizing cond2022
Methods for increasing a retention force between a polymeric scaffold and a deli2022
Single use injector2020
Method for assembling a scaffold-balloon catheter2019
Single use injector2019
Methods for increasing a retention force between a polymeric scaffold and a deli2018
Method and apparatus for removing support material2018
Removable sheath assembly for a polymer scaffold2017
Protective sheath assembly for a polymer scaffold2017
Polymer seaming using diffusion welds2017
Sheaths used with polymer scaffolds2017