Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7139944 | Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability | Thomas S. Barnett, Matthew S. Grady, William V. Huott, Michael R. Ouellette | 2006-11-21 |
| 6789032 | Method of statistical binning for reliability selection | Thomas S. Barnett, Matthew S. Grady, Kathleen G. Purdy | 2004-09-07 |