Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11561243 | Compliant organic substrate assembly for rigid probes | David M. Audette, Grant Wagner, Dennis R. Conti | 2023-01-24 |
| 11322473 | Interconnect and tuning thereof | David M. Audette, Grant Wagner, Dennis R. Conti | 2022-05-03 |
| 11029334 | Low force wafer test probe | David M. Audette, Dennis R. Conti, Grant Wagner | 2021-06-08 |
| 10663487 | Low force wafer test probe with variable geometry | David M. Audette, Dennis R. Conti, Grant Wagner | 2020-05-26 |
| 10444260 | Low force wafer test probe | David M. Audette, Dennis R. Conti, Grant Wagner | 2019-10-15 |
| 10261108 | Low force wafer test probe with variable geometry | David M. Audette, Dennis R. Conti, Grant Wagner | 2019-04-16 |
| 9437670 | Light activated test connections | Nathaniel R. Chadwick, John Bradley Deforge, John J. Ellis-Monaghan, Jeffrey P. Gambino, Ezra D. B. Hall +1 more | 2016-09-06 |
| 9269603 | Temporary liquid thermal interface material for surface tension adhesion and thermal control | Luc Guerin, George J. Lawson, Van Thanh Truong, Steve Whitehead | 2016-02-23 |
| 8854073 | Methods and apparatus for margin testing integrated circuits using asynchronously timed varied supply voltage and test patterns | David A. Grosch, Erik A. Nelson, Brian C. Noble | 2014-10-07 |
| 7759960 | Integrated circuit testing methods using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Franco Motika, Phil Nigh, Jody Van Horn +1 more | 2010-07-20 |
| 7567090 | Liquid recovery, collection method and apparatus in a non-recirculating test and burn-in application | Normand Cote, Peter J. Demko, David L. Gardell, Jeffrey D. Gelorme, George J. Lawson +1 more | 2009-07-28 |
| 7564256 | Integrated circuit testing methods using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Franco Motika, Phil Nigh, Jody Van Horn +1 more | 2009-07-21 |
| 7486098 | Integrated circuit testing method using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Franco Motika, Phil Nigh, Jody Van Horn +1 more | 2009-02-03 |
| 7400162 | Integrated circuit testing methods using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Franco Motika, Phil Nigh, Jody Van Horn +1 more | 2008-07-15 |
| 7332927 | Apparatus for temporary thermal coupling of an electronic device to a heat sink during test | Paul J. Aube, Normand Cote, Roger Gamache, David L. Gardell, Paul M. Gaschke +1 more | 2008-02-19 |
| 7265561 | Device burn in utilizing voltage control | Dennis R. Conti, Roger Gamache, David L. Gardell, Jody Van Horn | 2007-09-04 |
| 7259580 | Method and apparatus for temporary thermal coupling of an electronic device to a heat sink during test | Paul J. Aube, Normand Cote, Roger Gamache, David L. Gardell, Paul M. Gaschke +1 more | 2007-08-21 |
| 6577146 | Method of burning in an integrated circuit chip package | Roger Gamache, David L. Gardell | 2003-06-10 |
| 6504392 | Actively controlled heat sink for convective burn-in oven | John A. Fredeman, David L. Gardell, Mark R. LaForce | 2003-01-07 |
| 6122760 | Burn in technique for chips containing different types of IC circuitry | David A. Grosch | 2000-09-19 |