Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9535113 | Diversified exerciser and accelerator | David A. Grosch, Gregory V. Miller, Brian C. Noble, Ann L. Swift, Joel Thomas | 2017-01-03 |
| 9152517 | Programmable active thermal control | Harold W. Chase, Dennis R. Conti, James M. Crafts, David L. Gardell, Andrew T. Holle +1 more | 2015-10-06 |
| 7759960 | Integrated circuit testing methods using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Marc D. Knox, Franco Motika, Phil Nigh +1 more | 2010-07-20 |
| 7564256 | Integrated circuit testing methods using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Marc D. Knox, Franco Motika, Phil Nigh +1 more | 2009-07-21 |
| 7486098 | Integrated circuit testing method using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Marc D. Knox, Franco Motika, Phil Nigh +1 more | 2009-02-03 |
| 7400162 | Integrated circuit testing methods using well bias modification | Anne Elizabeth Gattiker, David A. Grosch, Marc D. Knox, Franco Motika, Phil Nigh +1 more | 2008-07-15 |
| 7298161 | Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability | Kerry Bernstein, Ronald J. Bolam, Edward J. Nowak, Alvin W. Strong, Ernest Y. Wu | 2007-11-20 |
| 7265561 | Device burn in utilizing voltage control | Dennis R. Conti, Roger Gamache, David L. Gardell, Marc D. Knox | 2007-09-04 |
| 7000162 | Integrated circuit phase partitioned power distribution for stress power reduction | Kerry Bernstein, Norman J. Rohrer | 2006-02-14 |
| 6891359 | Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability | Kerry Bernstein, Ronald J. Bolam, Edward J. Nowak, Alvin W. Strong, Ernest Y. Wu | 2005-05-10 |
| 6763314 | AC defect detection and failure avoidance power up and diagnostic system | Phillip J. Nigh | 2004-07-13 |
| 6618682 | Method for test optimization using historical and actual fabrication test data | Raymond J. Bulaga, Anne Elizabeth Gattiker, John L. Harris, Phillip J. Nigh, Leo A. Noel +2 more | 2003-09-09 |
| 6351134 | Semiconductor wafer test and burn-in | James M. Leas, Robert William Koss, George F. Walker, Charles H. Perry, David L. Gardell +2 more | 2002-02-26 |
| 5929651 | Semiconductor wafer test and burn-in | James M. Leas, Robert William Koss, George F. Walker, Charles H. Perry, David L. Gardell +2 more | 1999-07-27 |
| 5600257 | Semiconductor wafer test and burn-in | James M. Leas, Robert William Koss, George F. Walker, Charles H. Perry | 1997-02-04 |