| 6504392 |
Actively controlled heat sink for convective burn-in oven |
John A. Fredeman, David L. Gardell, Marc D. Knox |
2003-01-07 |
| 6275051 |
Segmented architecture for wafer test and burn-in |
Thomas W. Bachelder, Dennis R. Barringer, Dennis R. Conti, James M. Crafts, David L. Gardell +5 more |
2001-08-14 |
| 6262582 |
Mechanical fixture for holding electronic devices under test showing adjustments in multiple degrees of freedom |
Dennis R. Barringer, Mark A. Marnell, Donald W. Porter, Roger R. Schmidt, Wade H. White |
2001-07-17 |
| 6020750 |
Wafer test and burn-in platform using ceramic tile supports |
Daniel G. Berger, James N. Humenik, Charles H. Perry |
2000-02-01 |
| 5977787 |
Large area multiple-chip probe assembly and method of making the same |
Gobina Das, Paul M. Gaschke, Suryanarayan G. Hegde, Dale Curtis McHerron, Charles H. Perry +1 more |
1999-11-02 |
| 5001423 |
Dry interface thermal chuck temperature control system for semiconductor wafer testing |
Anthony J. Abrami, Stuart H. Bullard, Santiago del Puerto, Paul M. Gaschke, Paul J. Roggemann +1 more |
1991-03-19 |
