PG

Paul M. Gaschke

IBM: 13 patents #8,581 of 70,183Top 15%
📍 Pleasantville, NY: #44 of 229 inventorsTop 20%
🗺 New York: #10,487 of 115,490 inventorsTop 10%
Overall (All Time): #355,123 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
7332927 Apparatus for temporary thermal coupling of an electronic device to a heat sink during test Paul J. Aube, Normand Cote, Roger Gamache, David L. Gardell, Marc D. Knox +1 more 2008-02-19
7259580 Method and apparatus for temporary thermal coupling of an electronic device to a heat sink during test Paul J. Aube, Normand Cote, Roger Gamache, David L. Gardell, Marc D. Knox +1 more 2007-08-21
6967556 High power space transformer Franco Motika 2005-11-22
6868852 Cold weather breathing apparatus 2005-03-22
6426636 Wafer probe interface arrangement with nonresilient probe elements and support structure Gobinda Das, Steven J. Duda, Angelo M. Giaimo, Frederick L. Taber, Jr., John Vetrero 2002-07-30
6411112 Off-axis contact tip and dense packing design for a fine pitch probe Gobinda Das, Steven J. Duda 2002-06-25
6275051 Segmented architecture for wafer test and burn-in Thomas W. Bachelder, Dennis R. Barringer, Dennis R. Conti, James M. Crafts, David L. Gardell +5 more 2001-08-14
6196866 Vertical probe housing 2001-03-06
6086387 Cover assembly for a socket adaptable to IC modules of varying thickness used for burn-in testing Ethan E. Gallagher, David L. Gardell 2000-07-11
5977787 Large area multiple-chip probe assembly and method of making the same Gobina Das, Suryanarayan G. Hegde, Mark R. LaForce, Dale Curtis McHerron, Charles H. Perry +1 more 1999-11-02
5748007 Universal test and burn-in socket adaptable to varying IC module thickness 1998-05-05
5186238 Liquid film interface cooling chuck for semiconductor wafer processing Santiago del Puerto 1993-02-16
5088006 Liquid film interface cooling system for semiconductor wafer processing Santiago del Puerto 1992-02-11
5001423 Dry interface thermal chuck temperature control system for semiconductor wafer testing Anthony J. Abrami, Stuart H. Bullard, Santiago del Puerto, Mark R. LaForce, Paul J. Roggemann +1 more 1991-03-19