Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571490 | Solder bump array probe tip structure for laser cleaning | David M. Audette, Dennis M. Bronson, Jr., Dustin M. Fregeau, David L. Gardell, Frederick H. Roy, III +2 more | 2020-02-25 |
| 9847213 | Vacuum trap | David R. Crawford, Robert E. Desrosiers, Tracy C. Hetrick, Mousa H. Ishaq | 2017-12-19 |
| 9835653 | Solder bump array probe tip structure for laser cleaning | David M. Audette, Dennis M. Bronson, Jr., Dustin M. Fregeau, David L. Gardell, Frederick H. Roy, III +2 more | 2017-12-05 |
| 9708508 | Slurry for chemical-mechanical polishing of metals and use thereof | Graham M. Bates, Michael T. Brigham, Jason P. Ritter, Matthew T. Tiersch, Eva A. Shah +1 more | 2017-07-18 |
| 9057004 | Slurry for chemical-mechanical polishing of metals and use thereof | Graham M. Bates, Michael T. Brigham, Jason P. Ritter, Matthew T. Tiersch, Eva A. Shah +1 more | 2015-06-16 |
| 9057388 | Vacuum trap | David R. Crawford, Robert E. Desrosiers, Tracy C. Hetrick, Mousa H. Ishaq | 2015-06-16 |
| 8734665 | Slurry for chemical-mechanical polishing of copper and use thereof | Graham M. Bates, Michael T. Brigham, Jason P. Ritter, Eva A. Shah, Matthew T. Tiersch +1 more | 2014-05-27 |
| 8636917 | Solution for forming polishing slurry, polishing slurry and related methods | Marina M. Katsnelson, Matthew T. Tiersch, Eric J. White | 2014-01-28 |
| 8328892 | Solution for forming polishing slurry, polishing slurry and related methods | Marina M. Katsnelson, Matthew T. Tiersch, Eric J. White | 2012-12-11 |
| 8236580 | Copper contamination detection method and system for monitoring copper contamination | Jay Burnham, Leslie Peter Crane, James R. Elliott, Scott A. Estes, James S. Nakos +1 more | 2012-08-07 |
| 7957917 | Copper contamination detection method and system for monitoring copper contamination | Jay Burnham, Leslie Peter Crane, James R. Elliott, Scott A. Estes, James S. Nakos +1 more | 2011-06-07 |
| 7888142 | Copper contamination detection method and system for monitoring copper contamination | Jay Burnham, Leslie Peter Crane, James R. Elliott, Scott A. Estes, James S. Nakos +1 more | 2011-02-15 |
| 7824568 | Solution for forming polishing slurry, polishing slurry and related methods | Marina M. Katsnelson, Matthew T. Tiersch, Eric J. White | 2010-11-02 |
| 7442552 | Pressurized oxygen for evaluation of molding compound stability in semiconductor packaging | Adele M. Mahoney, Jason P. Ritter, Gerald J. Scilla, Charles H. Wilson | 2008-10-28 |
| 7300796 | Pressurized oxygen for evaluation of molding compound stability in semiconductor packaging | Adele M. Mahoney, Jason P. Ritter, Gerald J. Scilla, Charles H. Wilson | 2007-11-27 |