Issued Patents All Time
Showing 25 most recent of 78 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378623 | Diagnostic enhancement for multiple instances of identical structures | Orazio P. Forlenza, Mary P. Kusko, Franco Motika, Gerard M. Salem | 2022-07-05 |
| 11112854 | Operating pulsed latches on a variable power supply | Raghu G. GopalaKrishnaSetty, Mary P. Kusko, Hari Krishnan Rajeev, James D. Warnock | 2021-09-07 |
| 10816599 | Dynamically power noise adaptive automatic test pattern generation | Raghu G. GopalaKrishnaSetty, Sumit Panigrahi, Mary P. Kusko | 2020-10-27 |
| 10386912 | Operating pulsed latches on a variable power supply | Raghu G. GopalaKrishnaSetty, Mary P. Kusko, Hari Krishnan Rajeev, James D. Warnock | 2019-08-20 |
| 10379159 | Minimization of over-masking in an on product multiple input signature register (OPMISR) | Michael J. Hamilton, Amanda R. Kaufer, Matthew B. Schallhorn, Mary P. Kusko | 2019-08-13 |
| 10371749 | Removal of over-masking in an on product multiple input signature register (OPMISR) test | Mary P. Kusko, Amanda R. Kaufer, Michael J. Hamilton, Matthew B. Schallhorn | 2019-08-06 |
| 10371750 | Minimization of over-masking in an on product multiple input signature register (OPMISR) | Mary P. Kusko, Matthew B. Schallhorn | 2019-08-06 |
| 10372853 | Implementing enhanced diagnostics with intelligent pattern combination in automatic test pattern generation (ATPG) | Michael J. Hamilton, Amanda R. Kaufer, Phillip A. Senum | 2019-08-06 |
| 10359471 | Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through scan skewing | Michael J. Hamilton, Amanda R. Kaufer, Phillip A. Senum | 2019-07-23 |
| 10345380 | Implementing over-masking removal in an on product multiple input signature register (OPMISR) test due to common channel mask scan registers (CMSR) loading | Matthew B. Schallhorn, Mary P. Kusko, Amanda R. Kaufer, Michael J. Hamilton | 2019-07-09 |
| 10234507 | Implementing register array (RA) repair using LBIST | Michael J. Hamilton, Amanda R. Kaufer, Phillip A. Senum | 2019-03-19 |
| 10067183 | Portion isolation architecture for chip isolation test | Raghu G. Gaurav, Mary P. Kusko, Hari Krishnan Rajeev | 2018-09-04 |
| 10060978 | Implementing prioritized compressed failure defects for efficient scan diagnostics | Michael J. Hamilton, Amanda R. Kaufer | 2018-08-28 |
| 10060971 | Adjusting latency in a scan cell | Raghu G. GopalaKrishnaSetty, Mary P. Kusko | 2018-08-28 |
| 10024917 | Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through spreading in stumpmux daisy-chain structure | Michael J. Hamilton, Amanda R. Kaufer, Phillip A. Senum | 2018-07-17 |
| 10024914 | Diagnosing failure locations of an integrated circuit with logic built-in self-test | Amanda R. Kaufer, Leah Pfeifer Pastel | 2018-07-17 |
| 10001523 | Adjusting latency in a scan cell | Raghu G. GopalaKrishnaSetty, Mary P. Kusko | 2018-06-19 |
| 9964591 | Implementing decreased scan data interdependence in on product multiple input signature register (OPMISR) through PRPG control rotation | Michael J. Hamilton, Amanda R. Kaufer, Phillip A. Senum | 2018-05-08 |
| 9746516 | Collecting diagnostic data from chips | Ryan A. Fitch, William V. Huott, Mary P. Kusko | 2017-08-29 |
| 9726723 | Scan chain processing in a partially functional chip | Ronald Edward Fuhs | 2017-08-08 |
| 9575120 | Scan chain processing in a partially functional chip | Ronald Edward Fuhs | 2017-02-21 |
| 9568549 | Managing redundancy repair using boundary scans | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2017-02-14 |
| 9557383 | Partitioned scan chain diagnostics using multiple bypass structures and injection points | Michael J. Hamilton, Amanda R. Kaufer | 2017-01-31 |
| 9551747 | Inserting bypass structures at tap points to reduce latch dependency during scan testing | Michael J. Hamilton, Amanda R. Kaufer | 2017-01-24 |
| 9547039 | Inserting bypass structures at tap points to reduce latch dependency during scan testing | Michael J. Hamilton, Amanda R. Kaufer | 2017-01-17 |