Issued Patents All Time
Showing 1–25 of 31 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10379159 | Minimization of over-masking in an on product multiple input signature register (OPMISR) | Steven M. Douskey, Michael J. Hamilton, Matthew B. Schallhorn, Mary P. Kusko | 2019-08-13 |
| 10372853 | Implementing enhanced diagnostics with intelligent pattern combination in automatic test pattern generation (ATPG) | Steven M. Douskey, Michael J. Hamilton, Phillip A. Senum | 2019-08-06 |
| 10371749 | Removal of over-masking in an on product multiple input signature register (OPMISR) test | Steven M. Douskey, Mary P. Kusko, Michael J. Hamilton, Matthew B. Schallhorn | 2019-08-06 |
| 10359471 | Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through scan skewing | Steven M. Douskey, Michael J. Hamilton, Phillip A. Senum | 2019-07-23 |
| 10345380 | Implementing over-masking removal in an on product multiple input signature register (OPMISR) test due to common channel mask scan registers (CMSR) loading | Steven M. Douskey, Matthew B. Schallhorn, Mary P. Kusko, Michael J. Hamilton | 2019-07-09 |
| 10234507 | Implementing register array (RA) repair using LBIST | Steven M. Douskey, Michael J. Hamilton, Phillip A. Senum | 2019-03-19 |
| 10060978 | Implementing prioritized compressed failure defects for efficient scan diagnostics | Steven M. Douskey, Michael J. Hamilton | 2018-08-28 |
| 10024917 | Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through spreading in stumpmux daisy-chain structure | Steven M. Douskey, Michael J. Hamilton, Phillip A. Senum | 2018-07-17 |
| 10024914 | Diagnosing failure locations of an integrated circuit with logic built-in self-test | Steven M. Douskey, Leah Pfeifer Pastel | 2018-07-17 |
| 9964591 | Implementing decreased scan data interdependence in on product multiple input signature register (OPMISR) through PRPG control rotation | Steven M. Douskey, Michael J. Hamilton, Phillip A. Senum | 2018-05-08 |
| 9568549 | Managing redundancy repair using boundary scans | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2017-02-14 |
| 9557383 | Partitioned scan chain diagnostics using multiple bypass structures and injection points | Steven M. Douskey, Michael J. Hamilton | 2017-01-31 |
| 9551747 | Inserting bypass structures at tap points to reduce latch dependency during scan testing | Steven M. Douskey, Michael J. Hamilton | 2017-01-24 |
| 9547039 | Inserting bypass structures at tap points to reduce latch dependency during scan testing | Steven M. Douskey, Michael J. Hamilton | 2017-01-17 |
| 9529046 | Partitioned scan chain diagnostics using multiple bypass structures and injection points | Steven M. Douskey, Michael J. Hamilton | 2016-12-27 |
| 9429622 | Implementing enhanced scan chain diagnostics via bypass multiplexing structure | Steven M. Douskey, Michael J. Hamilton | 2016-08-30 |
| 9429621 | Implementing enhanced scan chain diagnostics via bypass multiplexing structure | Steven M. Douskey, Michael J. Hamilton | 2016-08-30 |
| 9366723 | Test coverage of integrated circuits with masking pattern selection | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2016-06-14 |
| 9201117 | Managing redundancy repair using boundary scans | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2015-12-01 |
| 9188636 | Self evaluation of system on a chip with multiple cores | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2015-11-17 |
| 9116205 | Test coverage of integrated circuits with test vector input spreading | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2015-08-25 |
| 9103879 | Test coverage of integrated circuits with test vector input spreading | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2015-08-11 |
| 9069041 | Self evaluation of system on a chip with multiple cores | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2015-06-30 |
| 9003244 | Dynamic built-in self-test system | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2015-04-07 |
| 8898530 | Dynamic built-in self-test system | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2014-11-25 |