Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10024914 | Diagnosing failure locations of an integrated circuit with logic built-in self-test | Steven M. Douskey, Amanda R. Kaufer | 2018-07-17 |
| 7870519 | Method for determining features associated with fails of integrated circuits | Rao H. Desineni, Maroun Kassab | 2011-01-11 |
| 7558999 | Learning based logic diagnosis | James W. Adkisson, John M. Cohn, Leendert M. Huisman, Maroun Kassab, David E. Sweenor | 2009-07-07 |
| 6865501 | Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection | Leendert M. Huisman, William V. Huott, Franco Motika | 2005-03-08 |