| 9244946 |
Data mining shape based data |
Leah Pastel, Adam E. Trojanowski |
2016-01-26 |
| 9235601 |
Data mining shape based data |
Leah Pastel, Adam E. Trojanowski |
2016-01-12 |
| 8571299 |
Identifying defects |
Mohammed Fazil Fayaz, Julie L. Lee, Leah Pastel |
2013-10-29 |
| 8566059 |
Insertion of faults in logic model used in simulation |
Rao H. Desineni, Mary P. Kusko, Leah Pastel |
2013-10-22 |
| 8136082 |
Method for testing integrated circuits |
Rao H. Desineni, Franco Motika, Leah Pastel |
2012-03-13 |
| 7971176 |
Method for testing integrated circuits |
Rao H. Desineni, Franco Motika, Leah Pastel |
2011-06-28 |
| 7870519 |
Method for determining features associated with fails of integrated circuits |
Rao H. Desineni, Leah Pfeifer Pastel |
2011-01-11 |
| 7853848 |
System and method for signature-based systematic condition detection and analysis |
Rao H. Desineni, Leah Pastel |
2010-12-14 |
| 7752514 |
Methods and apparatus for testing a scan chain to isolate defects |
Leendert M. Huisman, William V. Huott, Franco Motika |
2010-07-06 |
| 7596736 |
Iterative process for identifying systematics in data |
Leah Pastel |
2009-09-29 |
| 7558999 |
Learning based logic diagnosis |
James W. Adkisson, John M. Cohn, Leendert M. Huisman, Leah Pfeifer Pastel, David E. Sweenor |
2009-07-07 |
| 7313744 |
Methods and apparatus for testing a scan chain to isolate defects |
Leendert M. Huisman, William V. Huott, Franco Motika |
2007-12-25 |
| 6880136 |
Method to detect systematic defects in VLSI manufacturing |
Leendert M. Huisman, Leah Pastel |
2005-04-12 |
