Issued Patents All Time
Showing 26–31 of 31 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8856720 | Test coverage of integrated circuits with masking pattern selection | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2014-10-07 |
| 8762803 | Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs) | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2014-06-24 |
| 8667431 | Test coverage of integrated circuits with masking pattern selection | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2014-03-04 |
| 8627162 | Iimplementing enhanced aperture function calibration for logic built in self test (LBIST) | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2014-01-07 |
| 8516318 | Dynamic scan | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2013-08-20 |
| 8407542 | Implementing switching factor reduction in LBIST | Steven M. Douskey, Ryan A. Fitch, Michael J. Hamilton | 2013-03-26 |