Issued Patents All Time
Showing 26–50 of 78 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9529046 | Partitioned scan chain diagnostics using multiple bypass structures and injection points | Michael J. Hamilton, Amanda R. Kaufer | 2016-12-27 |
| 9429622 | Implementing enhanced scan chain diagnostics via bypass multiplexing structure | Michael J. Hamilton, Amanda R. Kaufer | 2016-08-30 |
| 9429621 | Implementing enhanced scan chain diagnostics via bypass multiplexing structure | Michael J. Hamilton, Amanda R. Kaufer | 2016-08-30 |
| 9404969 | Method and apparatus for efficient hierarchical chip testing and diagnostics with support for partially bad dies | Brion Keller, Mary P. Kusko | 2016-08-02 |
| 9378318 | Shared channel masks in on-product test compression system | Mary P. Kusko | 2016-06-28 |
| 9372232 | Collecting diagnostic data from chips | Ryan A. Fitch, William V. Huott, Mary P. Kusko | 2016-06-21 |
| 9366723 | Test coverage of integrated circuits with masking pattern selection | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2016-06-14 |
| 9355203 | Shared channel masks in on-product test compression system | Mary P. Kusko | 2016-05-31 |
| 9297856 | Implementing MISR compression methods for test time reduction | Mary P. Kusko, Cedric Lichtenau | 2016-03-29 |
| 9285423 | Managing chip testing data | Ryan A. Fitch, William V. Huott, Mary P. Kusko | 2016-03-15 |
| 9201117 | Managing redundancy repair using boundary scans | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2015-12-01 |
| 9188636 | Self evaluation of system on a chip with multiple cores | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2015-11-17 |
| 9151800 | Chip testing with exclusive OR | Mary P. Kusko, Cedric Lichtenau | 2015-10-06 |
| 9134373 | Hierarchal test block test pattern reduction in on-product test compression system | Mary P. Kusko | 2015-09-15 |
| 9134375 | Hierarchal test block test pattern reduction in on-product test compression system | Mary P. Kusko | 2015-09-15 |
| 9116205 | Test coverage of integrated circuits with test vector input spreading | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2015-08-25 |
| 9110135 | Chip testing with exclusive OR | Mary P. Kusko, Cedric Lichtenau | 2015-08-18 |
| 9103879 | Test coverage of integrated circuits with test vector input spreading | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2015-08-11 |
| 9069041 | Self evaluation of system on a chip with multiple cores | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2015-06-30 |
| 9032256 | Multi-core processor comparison encoding | Ryan A. Fitch, Michael J. Hamilton, Dennis Martin Rickert | 2015-05-12 |
| 9003244 | Dynamic built-in self-test system | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2015-04-07 |
| 8898530 | Dynamic built-in self-test system | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2014-11-25 |
| 8868975 | Testing and operating a multiprocessor chip with processor redundancy | Ralph E. Bellofatto, Rudolf A. Haring, Moyra K. McManus, Martin Ohmacht, Dietmar Schmunkamp +2 more | 2014-10-21 |
| 8856720 | Test coverage of integrated circuits with masking pattern selection | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2014-10-07 |
| 8762803 | Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs) | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2014-06-24 |