Issued Patents All Time
Showing 51–75 of 78 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8667431 | Test coverage of integrated circuits with masking pattern selection | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2014-03-04 |
| 8627162 | Iimplementing enhanced aperture function calibration for logic built in self test (LBIST) | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2014-01-07 |
| 8516318 | Dynamic scan | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2013-08-20 |
| 8407542 | Implementing switching factor reduction in LBIST | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2013-03-26 |
| 8365006 | Preventing circumvention of function disablement in an information handling system | Thomas Pflueger, Edward M. Seymour, Timothy M. Skergan | 2013-01-29 |
| 7949918 | Asynchronous communication using standard boundary architecture cells | Michael J. Hamilton, Brandon E. Schenck | 2011-05-24 |
| 7915929 | High-speed leaf clock frequency-divider/splitter | Matthew R. Ellavsky | 2011-03-29 |
| 7890824 | Asynchronous communication apparatus using JTAG test data registers | Michael J. Hamilton, Brandon E. Schenck | 2011-02-15 |
| 7830195 | Self-test design methodology and technique for root-gated clocking structure | Ryan A. Fitch, Brandon E. Schenck | 2010-11-09 |
| 7793184 | Lowering power consumption during logic built-in self-testing (LBIST) via channel suppression | — | 2010-09-07 |
| 7472324 | Logic built-in self-test channel skipping during functional scan operations | — | 2008-12-30 |
| 7457187 | Design structure for in-system redundant array repair in integrated circuits | Arthur A. Bright, Paul G. Crumley, Marc Dombrowa, Rudolf A. Haring, Steven F. Oakland +2 more | 2008-11-25 |
| 7405990 | Method and apparatus for in-system redundant array repair on integrated circuits | Arthur A. Bright, Paul G. Crumley, Marc Dombrowa, Rudolf A. Haring, Steven F. Oakland +2 more | 2008-07-29 |
| 7397709 | Method and apparatus for in-system redundant array repair on integrated circuits | Arthur A. Bright, Paul G. Crumley, Marc Dombrowa, Rudolf A. Haring, Steven F. Oakland +2 more | 2008-07-08 |
| 7310278 | Method and apparatus for in-system redundant array repair on integrated circuits | Arthur A. Bright, Paul G. Crumley, Marc Dombrowa, Rudolf A. Haring, Steven F. Oakland +2 more | 2007-12-18 |
| 7114109 | Method and apparatus for customizing and monitoring multiple interfaces and implementing enhanced fault tolerance and isolation features | James Fred Daily, Michael J. Hamilton | 2006-09-26 |
| 6807645 | Method and apparatus for implementing enhanced LBIST diagnostics of intermittent failures | Frank W. Angelotti | 2004-10-19 |
| 6735543 | Method and apparatus for testing, characterizing and tuning a chip interface | Daniel M. Dreps, Frank D. Ferraiolo, Curtis Walter Preuss, Robert J. Reese, Paul Rudrud +2 more | 2004-05-11 |
| 6711706 | Method and apparatus for elastic shorts testing, a hardware-assisted wire test mechanism | Frank D. Ferraiolo, Michael Stephen Floyd | 2004-03-23 |
| 6448835 | High-speed leaf splitter for clock gating | Bruce George Rudolph | 2002-09-10 |
| 6195775 | Boundary scan latch configuration for generalized scan designs | Paul Allen Ganfield, Daniel G. Young | 2001-02-27 |
| 6158032 | Data processing system, circuit arrangement and program product including multi-path scan interface and methods thereof | Guy Richard Currier, Leland Leslie Day, Paul Allen Ganfield, James Maurice Wallin | 2000-12-05 |
| 6115763 | Multi-core chip providing external core access with regular operation function interface and predetermined service operation services interface comprising core interface units and masters interface unit | Michael Charles Cogswell, Guy Richard Currier, John R. Elliott, Sharon D. Vincent, James Maurice Wallin +1 more | 2000-09-05 |
| 5717701 | Apparatus and method for testing interconnections between semiconductor devices | Frank W. Angelotti | 1998-02-10 |
| 5668816 | Method and apparatus for injecting errors into an array built-in self-test | Paul Wong | 1997-09-16 |