Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5617426 | Clocking mechanism for delay, short path and stuck-at testing | Bernd Koenemann, Mark L. Shulman | 1997-04-01 |
| 5150366 | Reduced delay circuits for shift register latch scan strings | Paul H. Bardell, Jr. | 1992-09-22 |
| 4513418 | Simultaneous self-testing system | Paul H. Bardell, Jr. | 1985-04-23 |
| 4503537 | Parallel path self-testing system | — | 1985-03-05 |