Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10310015 | Method and apparatus for providing clock signals for a scan chain | Thomas Clouqueur, Dwight K. Elvey | 2019-06-04 |
| 7293199 | Method and apparatus for testing memories with different read/write protocols using the same programmable memory bist controller | Tse Wei Daniel Ip | 2007-11-06 |
| 7260759 | Method and apparatus for an efficient memory built-in self test architecture for high performance microprocessors | Kenneth House, Syed A. Obaidulla | 2007-08-21 |
| 7206979 | Method and apparatus for at-speed diagnostics of embedded memories | Kenneth House, Seokjin Kim | 2007-04-17 |
| 7178076 | Architecture of an efficient at-speed programmable memory built-in self test | Seokjin Kim | 2007-02-13 |
| 7168005 | Programable multi-port memory BIST with compact microcode | R. Dean Adams, Thomas J. Eckenrode, Steven Lee Gregor | 2007-01-23 |
| 7032144 | Method and apparatus for testing multi-port memories | R. Dean Adams, Thomas J. Eckenrode, Steven Lee Gregor | 2006-04-18 |
| 6937958 | Controller for monitoring temperature | Spencer Gold, Claude Gauthier, Kenneth House | 2005-08-30 |
| 6893154 | Integrated temperature sensor | Spencer Gold, Claude Gauthier, Brian Amick, Steven R. Boyle | 2005-05-17 |
| 6874111 | System initialization of microcode-based memory built-in self-test | R. Dean Adams, Thomas J. Eckenrode, Steven Lee Gregor | 2005-03-29 |
| 6813201 | Automatic generation and validation of memory test models | Thomas A. Ziaja, Amitava Majumdar | 2004-11-02 |
| 6809557 | Increasing power supply noise rejection using linear voltage regulators in an on-chip temperature sensor | Claude Gauthier, Spencer Gold, Dean Liu, Brian Amick, Pradeep Trivedi | 2004-10-26 |
| 6806698 | Quantifying a difference between nodal voltages | Claude Gauthier, Brian Amick, Spencer Gold, Dean Liu, Pradeep Trivedi | 2004-10-19 |
| 6700946 | System and method for automatic generation of an at-speed counter | Kenneth House, Joseph Siegel | 2004-03-02 |
| 6681350 | Method and apparatus for testing memory cells for data retention faults | R. Dean Adams, Aneesha P. Deo | 2004-01-20 |
| 6651201 | Programmable memory built-in self-test combining microcode and finite state machine self-test | R. Dean Adams, Thomas J. Eckenrode, Steven Lee Gregor | 2003-11-18 |
| 6605988 | Low voltage temperature-independent and temperature-dependent voltage generator | Claude Gauthier, Brian Amick, Spencer Gold | 2003-08-12 |
| 6557127 | Method and apparatus for testing multi-port memories | R. Dean Adams, Thomas J. Eckenrode, Steven Lee Gregor | 2003-04-29 |
| 5691990 | Hybrid partial scan method | Rohit Kapur, Thomas J. Snethen | 1997-11-25 |