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Interposer with beyond reticle field conductor pads |
Michael Alfano, Bryan Black, Michael Z. Su, Julius Din, Anwar Kashem |
2017-10-31 |
| 9627281 |
Semiconductor chip with thermal interface tape |
Seth Prejean, Dales Morrison Kent, Ronnie Brandon, Gamal Refai-Ahmed, Michael Z. Su +2 more |
2017-04-18 |
| 8850278 |
Fault tolerant scannable glitch latch |
Kevin M. Gillespie, Dwight K. Elvey, Harry Ray Fair, III |
2014-09-30 |
| 8451014 |
Die stacking, testing and packaging for yield |
Bryan Black |
2013-05-28 |
| 7228474 |
Semiconductor device and method and apparatus for testing such a device |
Emrys J. Williams, Kenneth House |
2007-06-05 |
| 7000164 |
Method for scan testing and clocking dynamic domino circuits in VLSI systems using level sensitive latches and edge triggered flip flops |
David Greenhill, Ban Wong |
2006-02-14 |
| 6996491 |
Method and system for monitoring and profiling an integrated circuit die temperature |
Spencer Gold, Claude Gauthier, Steven R. Boyle, Kenneth House |
2006-02-07 |
| 6907556 |
Scanable R-S glitch latch for dynamic circuits |
— |
2005-06-14 |
| 6785855 |
Implementation of an assertion check in ATPG models |
Aiteen Zhang |
2004-08-31 |
| 6720813 |
Dual edge-triggered flip-flop design with asynchronous programmable reset |
Gin Yee, Pradeep Trivedi |
2004-04-13 |
| 6700946 |
System and method for automatic generation of an at-speed counter |
Kamran Zarrineh, Kenneth House |
2004-03-02 |
| 6594194 |
Memory array with common word line |
Spencer Gold |
2003-07-15 |
| 6570407 |
Scannable latch for a dynamic circuit |
Junji Sugisawa, Larry Kan, David Greenhill |
2003-05-27 |
| 6487702 |
Automated decoupling capacitor insertion |
Chen-Li Lin, Joel Grinberg |
2002-11-26 |
