Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10310015 | Method and apparatus for providing clock signals for a scan chain | Thomas Clouqueur, Kamran Zarrineh | 2019-06-04 |
| 9000806 | Preventing A-B-A race in a latch-based device | Someshwar Gatty | 2015-04-07 |
| 8850278 | Fault tolerant scannable glitch latch | Kevin M. Gillespie, Joseph Siegel, Harry Ray Fair, III | 2014-09-30 |
| 8461874 | Preventing A-B-A race in a latch-based device | Someshwar Gatty | 2013-06-11 |
| 7817761 | Test techniques for a delay-locked loop receiver interface | Meei-Ling Chiang, Sanjeev K. Maheshwari, Emerson S. Fang | 2010-10-19 |
| 7685487 | Simultaneous core testing in multi-core integrated circuits | Ting-Yu Kuo | 2010-03-23 |
| 6636997 | System and method for improving LBIST test coverage | Paul Wong, Mark O. Porter | 2003-10-21 |
| 4504783 | Test fixture for providing electrical access to each I/O pin of a VLSI chip having a large number of I/O pins | John J. Zasio, Ronald Tanizawa | 1985-03-12 |