| 6337576 |
Wafer-level burn-in |
Andrew K. Wiggin, Allan Calamoneri, Martin Goetz, George E. Avery, Sammy K. Brown |
2002-01-08 |
| 6300161 |
Module and method for interconnecting integrated circuits that facilitates high speed signal propagation with reduced noise |
Martin Goetz |
2001-10-09 |
| 5570036 |
CMOS buffer circuit having power-down feature |
Robert K. Montoye |
1996-10-29 |
| 5541528 |
CMOS buffer circuit having increased speed |
Robert K. Montoye, Creigton S. Asato, Tarang Patil |
1996-07-30 |
| 5095356 |
Cellular integrated circuit and hierarchical method |
Hisashige Ando, Hung C. Lai |
1992-03-10 |
| 4969029 |
Cellular integrated circuit and hierarchial method |
Hisashige Ando, Hung C. Lai |
1990-11-06 |
| 4937770 |
Simulation system |
Michael W. Samuels |
1990-06-26 |
| 4924430 |
Static timing analysis of semiconductor digital circuits |
Kenneth Chan Choy, Darrell R. Parham |
1990-05-08 |
| 4782283 |
Apparatus for scan testing CMOS integrated systems |
— |
1988-11-01 |
| 4737933 |
CMOS multiport general purpose register |
Michael Chiang, Tien-Lai Hwang |
1988-04-12 |
| 4587480 |
Delay testing method for CMOS LSI and VLSI integrated circuits |
— |
1986-05-06 |
| 4553236 |
System for detecting and correcting errors in a CMOS computer system |
Larry Cooke |
1985-11-12 |
| 4504783 |
Test fixture for providing electrical access to each I/O pin of a VLSI chip having a large number of I/O pins |
Dwight K. Elvey, Ronald Tanizawa |
1985-03-12 |
| 4495628 |
CMOS LSI and VLSI chips having internal delay testing capability |
— |
1985-01-22 |
| 4495629 |
CMOS scannable latch |
Larry Cooke |
1985-01-22 |
| 4458129 |
Discharge device and method for use in processing semiconductor devices |
Michael W. Samuels |
1984-07-03 |
| 4442361 |
System and method for calibrating electron beam systems |
Larry Cooke, Raymond Paul |
1984-04-10 |
| 4420691 |
Method of aligning electron beam apparatus |
— |
1983-12-13 |
| 4414480 |
CMOS Circuit using transmission line interconnections |
— |
1983-11-08 |
| 4396971 |
LSI Chip package and method |
Robert J. Beall |
1983-08-02 |
| 4350866 |
Discharge device and method for use in processing semiconductor devices |
Michael W. Samuels |
1982-09-21 |
| 4191916 |
Table positioning system including optical reference position measuring transducer |
Michael W. Samuels |
1980-03-04 |
