DK

Dales Morrison Kent

IBM: 12 patents #9,222 of 70,183Top 15%
AM AMD: 2 patents #3,994 of 9,279Top 45%
Overall (All Time): #381,586 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9627281 Semiconductor chip with thermal interface tape Seth Prejean, Ronnie Brandon, Gamal Refai-Ahmed, Michael Z. Su, Michael D. Bienek +2 more 2017-04-18
7479796 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Kenneth Carl Larsen, Howard Victor Mahaney, Jr., Hoa Thanh Phan +1 more 2009-01-20
7466155 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Kenneth Carl Larsen, Howard Victor Mahaney, Jr., Hoa Thanh Phan +1 more 2008-12-16
7463017 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Kenneth Carl Larsen, Howard Victor Mahaney, Jr., Hoa Thanh Phan +1 more 2008-12-09
7456644 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Kenneth Carl Larsen, Howard Victor Mahaney, Jr., Hoa Thanh Phan +1 more 2008-11-25
7453279 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Kenneth Carl Larsen, Howard Victor Mahaney, Jr., Hoa Thanh Phan +1 more 2008-11-18
7425822 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Kenneth Carl Larsen, Howard Victor Mahaney, Jr., Hoa Thanh Phan +1 more 2008-09-16
7423440 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Kenneth Carl Larsen, Howard Victor Mahaney, Jr., Hoa Thanh Phan +1 more 2008-09-09
7405583 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Kenneth Carl Larsen, Howard Victor Mahaney, Jr., Hoa Thanh Phan +1 more 2008-07-29
7352200 Functional and stress testing of LGA devices John Saunders Corbin, Jr., Jose Arturo Garza, Jr., Kenneth Carl Larsen, Howard Victor Mahaney, Jr., Hoa Thanh Phan +1 more 2008-04-01
7135877 Temperature and condensation control system for functional tester Daniel Paul Beaman, John Saunders Corbin, Jr., Howard Victor Mahaney, Jr., Hoa Thanh Phan, Frederic Wright 2006-11-14
7119433 Packaging for enhanced thermal and structural performance of electronic chip modules John Saunders Corbin, Jr., Gary F. Goth, William P. Kostenko, Roger R. Schmidt, John G. Torok 2006-10-10
5910884 Heatsink retention and air duct assembly Jose Arturo Garza, Jr., Ciro Neal Ramirez, Rajeev Ranjan Sinha 1999-06-08