| 8402421 |
Method and system for subnet defect diagnostics through fault compositing |
Joseph Michael Swenton |
2013-03-19 |
| 8397113 |
Method and system for identifying power defects using test pattern switching activity |
Patrick Gallagher |
2013-03-12 |
| 8190953 |
Method and system for selecting test vectors in statistical volume diagnosis using failed test data |
Sameer H. Chakravarthy, Ratan Singh, Joseph Michael Swenton, Shaleen Bhabu |
2012-05-29 |
| 8120378 |
System to control insertion of care-bits in an IC test vector improved optical probing |
Joseph Michael Swenton, Richard Schoonover, David Sliwinski |
2012-02-21 |
| 7821276 |
Method and article of manufacture to generate IC test vector for synchronized physical probing |
Joseph Michael Swenton, Richard Schoonover, David Sliwinski |
2010-10-26 |
| 7496816 |
Isolating the location of defects in scan chains |
Joseph Michael Swenton, David Sliwinski |
2009-02-24 |
| 6901542 |
Internal cache for on chip test data storage |
L. Farnsworth, Douglas C. Heaberlin, Edward E. Horton, III, Leendert M. Huisman, Leah Pastel +3 more |
2005-05-31 |
| 6721914 |
Diagnosis of combinational logic circuit failures |
Douglas C. Heaberlin, Leendert M. Huisman |
2004-04-13 |
| 6708306 |
Method for diagnosing failures using invariant analysis |
Joseph Michael Swenton |
2004-03-16 |
| 6675323 |
Incremental fault dictionary |
Douglas C. Heaberlin, Leendert M. Huisman, Thomas F. Mechler, Leah Pastel, Glen E. Richard +1 more |
2004-01-06 |
