Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10256204 | Separation of integrated circuit structure from adjacent chip | Stephen P. Ayotte, Hanyi Ding | 2019-04-09 |
| 10245667 | Chip joining by induction heating | Stephen P. Ayotte, Timothy D. Sullivan, Timothy M. Sullivan | 2019-04-02 |
| 10050012 | Method for semiconductor die removal rework | Stephen P. Ayotte, Timothy M. Sullivan | 2018-08-14 |
| 9776270 | Chip joining by induction heating | Stephen P. Ayotte, Timothy D. Sullivan, Timothy M. Sullivan | 2017-10-03 |
| 9711422 | Visually detecting electrostatic discharge events | Stephen P. Ayotte, David John Hill, John Thomas Kinnear, Jr., Timothy M. Sullivan, Heather M. Truax | 2017-07-18 |
| 9704830 | Semiconductor structure and method of making | Stephen P. Ayotte, Timothy M. Sullivan | 2017-07-11 |
| 9645573 | Reliability monitor test strategy definition | Stephen P. Ayotte, Petra U. Klinger-Park, Mark T.W. Lam, Sanda S. Myat | 2017-05-09 |
| 9508680 | Induction heating for underfill removal and chip rework | Stephen P. Ayotte, Timothy M. Sullivan | 2016-11-29 |
| 9472490 | IC structure with recessed solder bump area and methods of forming same | Timothy M. Sullivan, Stephen P. Ayotte, Timothy D. Sullivan | 2016-10-18 |
| 9190375 | Solder bump reflow by induction heating | Stephen P. Ayotte, Sébastien S. Quesnel, Timothy D. Sullivan, Timothy M. Sullivan | 2015-11-17 |
| 9177931 | Reducing thermal energy transfer during chip-join processing | Stephen P. Ayotte, Sébastien S. Quesnel, Timothy D. Sullivan, Timothy M. Sullivan | 2015-11-03 |
| 9105573 | Visually detecting electrostatic discharge events | Stephen P. Ayotte, David John Hill, John Thomas Kinnear, Jr., Timothy M. Sullivan, Heather M. Truax | 2015-08-11 |
| 9059097 | Inhibiting propagation of imperfections in semiconductor devices | Stephen P. Ayotte, David John Hill, Timothy M. Sullivan, Heather M. Truax | 2015-06-16 |
| 8765593 | Controlled collapse chip connection (C4) structure and methods of forming | Stephen P. Ayotte, Timothy H. Daubenspeck, David John Hill, Timothy M. Sullivan | 2014-07-01 |
| 6901542 | Internal cache for on chip test data storage | Thomas Bartenstein, L. Farnsworth, Douglas C. Heaberlin, Edward E. Horton, III, Leendert M. Huisman +3 more | 2005-05-31 |
| 6675323 | Incremental fault dictionary | Thomas Bartenstein, Douglas C. Heaberlin, Leendert M. Huisman, Thomas F. Mechler, Leah Pastel +1 more | 2004-01-06 |