Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8719651 | Scan chain diagnostic using scan stitching | Nilabha Dev, Sameer Chakravarthy Chillarige | 2014-05-06 |
| 8595681 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Senthil Arasu Thirunavukarasu, Vivek Chickermane | 2013-11-26 |
| 8584074 | Testing to prescribe state capture by, and state retrieval from scan registers | Senthil Arasu Thirunavukarasu, Vivek Chickermane | 2013-11-12 |
| 8438528 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Senthil Arasu Thirunavukarasu, Vivek Chickermane | 2013-05-07 |
| 8429593 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Senthil Arasu Thirunavukarasu, Vivek Chickermane | 2013-04-23 |
| 8392868 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Senthil Arasu Thirunavukarasu, Vivek Chickermane | 2013-03-05 |
| 8336019 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Senthil Arasu Thirunavukarasu, Vivek Chickermane | 2012-12-18 |
| 8286123 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Senthil Arasu Thirunavukarasu, Vivek Chickermane | 2012-10-09 |
| 8190953 | Method and system for selecting test vectors in statistical volume diagnosis using failed test data | Sameer H. Chakravarthy, Ratan Singh, Thomas Bartenstein, Joseph Michael Swenton | 2012-05-29 |
| 7944285 | Method and apparatus to detect manufacturing faults in power switches | Senthil Arasu Thirunavukarasu, Bambuda Chen Chien Leung, Vivek Chickermane | 2011-05-17 |
| 7886263 | Testing to prescribe state capture by, and state retrieval from scan registers | Senthil Arasu Thirunavukarasu, Vivek Chickermane | 2011-02-08 |
| 7877715 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Senthil Arasu Thirunavukarasu, Vivek Chickermane | 2011-01-25 |