Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8595681 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Shaleen Bhabu, Vivek Chickermane | 2013-11-26 |
| 8584074 | Testing to prescribe state capture by, and state retrieval from scan registers | Vivek Chickermane, Shaleen Bhabu | 2013-11-12 |
| 8438528 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Shaleen Bhabu, Vivek Chickermane | 2013-05-07 |
| 8429593 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Shaleen Bhabu, Vivek Chickermane | 2013-04-23 |
| 8392868 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Shaleen Bhabu, Vivek Chickermane | 2013-03-05 |
| 8336019 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Shaleen Bhabu, Vivek Chickermane | 2012-12-18 |
| 8286123 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Shaleen Bhabu, Vivek Chickermane | 2012-10-09 |
| 7944285 | Method and apparatus to detect manufacturing faults in power switches | Bambuda Chen Chien Leung, Shaleen Bhabu, Vivek Chickermane | 2011-05-17 |
| 7886263 | Testing to prescribe state capture by, and state retrieval from scan registers | Vivek Chickermane, Shaleen Bhabu | 2011-02-08 |
| 7877715 | Method and apparatus to use physical design information to detect IR drop prone test patterns | Shaleen Bhabu, Vivek Chickermane | 2011-01-25 |
| 7596773 | Automating optimal placement of macro-blocks in the design of an integrated circuit | Thenappan Meyyappan, Sreekantha Madhava Katla, Ramesh SrinivasRao Guzar | 2009-09-29 |
| 7555687 | Sequential scan technique for testing integrated circuits with reduced power, time and/or cost | Devanathan Varadarajan | 2009-06-30 |
| 7277803 | Efficient calculation of a number of transitions and estimation of power dissipation in sequential scan tests | Devanathan Varadarajan | 2007-10-02 |