Devanathan Varadarajan — 25 Patents at Texas Instruments

Devanathan Varadarajan has been granted 25 US patents while listed as an inventor at Texas Instruments. The first was granted in 2007 and the most recent in April 2025. Devanathan Varadarajan ranks #158,593 of 4,157,543 US inventors in our database (top 3.8%). Patent records list Devanathan Varadarajan in Allen, TX, US.

Patents per Year

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Showing 1–25 of 25 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12283332	Memory BIST circuit and method	—	2025-04-22
12259789	Non-volatile memory compression for memory repair	Ramakrishnan Venkatasubramanian, Varun Singh	2025-03-25
12243603	At-speed test of functional memory interface logic in devices	Lei Wu	2025-03-04
12217102	Distributed mechanism for fine-grained test power control	Varun Singh, Jose Luis Flores, Rejitha Nair, David Matthew Thompson	2025-02-04
12147697	Methods and apparatus to characterize memory	—	2024-11-19	$56,184,000
12085610	Methods and apparatus to identify faults in processors	Benjamin Niewenhuis	2024-09-10	$30,309,000
12033711	Built-in memory repair with repair code compression	Varun Singh	2024-07-09	$47,758,000
12009045	Management of multiple memory in-field self-repair options	Varun Singh	2024-06-11	$44,466,000
11881275	Screening of memory circuits	Francisco A. Cano, Anthony M. Hill	2024-01-23	$24,621,000
11748202	Non-volatile memory compression for memory repair	Ramakrishnan Venkatasubramanian, Varun Singh	2023-09-05	$26,549,000
11631472	Built-in memory repair with repair code compression	Varun Singh	2023-04-18	$65,786,000
11568951	Screening of memory circuits	Francisco A. Cano, Anthony M. Hill	2023-01-31	$26,595,000
11436090	Non-volatile memory compression for memory repair	Ramakrishnan Venkatasubramanian, Varun Singh	2022-09-06	$32,761,000
11373726	Management of multiple memory in-field self-repair options	Varun Singh	2022-06-28	$26,335,000
11087857	Enabling high at-speed test coverage of functional memory interface logic by selective usage of test paths	Lei Wu	2021-08-10	$40,116,000
10600495	Parallel memory self-testing	Sumant Dinkar Kale	2020-03-24	$17,530,000
10134483	Centralized built-in soft-repair architecture for integrated circuits with embedded memories	Sumant Dinkar Kale	2018-11-20	$20,577,000
9852810	Optimizing fuseROM usage for memory repair	Harsharaj Ellur	2017-12-26	$16,353,000
9698779	Reconfiguring an ASIC at runtime	Karthik Srinivasan, Neel Talakshi Gala	2017-07-04
9318222	Hierarchical, distributed built-in self-repair solution	Raghavendra Prasad KS, Harsharaj Ellur	2016-04-19	$24,153,000
9053799	Optimizing fuseROM usage for memory repair	Harsharaj Ellur	2015-06-09	$10,012,000
8051347	Scan-enabled method and system for testing a system-on-chip	Bindu Dibbur Narasingarao, Viraj Narendra Patil	2011-11-01	$4,844,000
7555687	Sequential scan technique for testing integrated circuits with reduced power, time and/or cost	Senthil Arasu Thirunavukarasu	2009-06-30	$11,860,000
7380184	Sequential scan technique providing enhanced fault coverage in an integrated circuit	—	2008-05-27	$13,463,000
7277803	Efficient calculation of a number of transitions and estimation of power dissipation in sequential scan tests	Senthil Arasu Thirunavukarasu	2007-10-02	$14,221,000

Devanathan Varadarajan — 25 Patents

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