Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11893336 | Utilizing transition ATPG test patterns to detect multicycle faults and/or defects in an IC chip | Arvind Chokhani, Martin Thomas Amodeo | 2024-02-06 |
| 11892501 | Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns | Arvind Chokhani, Martin Thomas Amodeo | 2024-02-06 |
| 11740284 | Diagnosing multicycle faults and/or defects with single cycle ATPG test patterns | Arvind Chokhani, Martin Thomas Amodeo | 2023-08-29 |
| 11579194 | Utilizing single cycle ATPG test patterns to detect multicycle cell-aware defects | Arvind Chokhani, Martin Thomas Amodeo | 2023-02-14 |
| 11435401 | Timed transition cell-aware ATPG using fault rule files and SDF for testing an IC chip | Arvind Chokhani, Santosh Subhaschandra Malagi | 2022-09-06 |
| 11429776 | Fault rules files for testing an IC chip | Arvind Chokhani, Santosh Subhaschandra Malagi | 2022-08-30 |
| 10338137 | Highly accurate defect identification and prioritization of fault locations | Sameer Chakravarthy Chillarige, Anil Malik, Sharjinder Singh | 2019-07-02 |
| 10180457 | System and method performing scan chain diagnosis of an electronic design | Sameer Chakravarthy Chillarige, Sharjinder Singh, Anil Malik | 2019-01-15 |
| 10060976 | Method and apparatus for automatic diagnosis of mis-compares | Sharjinder Singh, Sameer Chakravarthy Chillarige, Robert Jordan Asher, Sonam Kathpalia, Patrick Gallagher | 2018-08-28 |
| 9864004 | System and method for diagnosing failure locations in electronic circuits | Sameer Chakravarthy Chillarige, Brion Keller, Sharjinder Singh, Anil Malik | 2018-01-09 |
| 9400311 | Method and system of collective failure diagnosis for multiple electronic circuits | Anil Malik, Sameer Chakravarthy Chillarige, Sharjinder Singh, Gilbert Vandling | 2016-07-26 |
| 8813004 | Analog fault visualization system and method for circuit designs | Donald J. O'Riordan, Hao Ji | 2014-08-19 |
| 8402421 | Method and system for subnet defect diagnostics through fault compositing | Thomas Bartenstein | 2013-03-19 |
| 8190953 | Method and system for selecting test vectors in statistical volume diagnosis using failed test data | Sameer H. Chakravarthy, Ratan Singh, Thomas Bartenstein, Shaleen Bhabu | 2012-05-29 |
| 8120378 | System to control insertion of care-bits in an IC test vector improved optical probing | Thomas Bartenstein, Richard Schoonover, David Sliwinski | 2012-02-21 |
| 7821276 | Method and article of manufacture to generate IC test vector for synchronized physical probing | Thomas Bartenstein, Richard Schoonover, David Sliwinski | 2010-10-26 |
| 7496816 | Isolating the location of defects in scan chains | Thomas Bartenstein, David Sliwinski | 2009-02-24 |
| 6708306 | Method for diagnosing failures using invariant analysis | Thomas Bartenstein | 2004-03-16 |