| 11592482 |
Scan channel slicing for compression-mode testing of scan chains |
Anil Malik, Bharath Nandakumar |
2023-02-28 |
| 10996270 |
System and method for multiple device diagnostics and failure grouping |
Joe Swenton, Anil Malik, Krishna Vijaya Chakravadhanula |
2021-05-04 |
| 10853100 |
Systems and methods for creating learning-based personalized user interfaces |
Sonam Kathpalia, Mehakpreet Kaur, Krishna Vijaya Chakravadhanula |
2020-12-01 |
| 10338137 |
Highly accurate defect identification and prioritization of fault locations |
Anil Malik, Sharjinder Singh, Joseph Michael Swenton |
2019-07-02 |
| 10325048 |
Virtual directory navigation and debugging across multiple test configurations in the same session |
Sonam Kathpalia, Mehakpreet Kaur, James Allen, Krishna Vijaya Chakravadhanula |
2019-06-18 |
| 10180457 |
System and method performing scan chain diagnosis of an electronic design |
Sharjinder Singh, Anil Malik, Joseph Michael Swenton |
2019-01-15 |
| 10060976 |
Method and apparatus for automatic diagnosis of mis-compares |
Sharjinder Singh, Robert Jordan Asher, Sonam Kathpalia, Patrick Gallagher, Joseph Michael Swenton |
2018-08-28 |
| 9864004 |
System and method for diagnosing failure locations in electronic circuits |
Brion Keller, Joseph Michael Swenton, Sharjinder Singh, Anil Malik |
2018-01-09 |
| 9400311 |
Method and system of collective failure diagnosis for multiple electronic circuits |
Anil Malik, Sharjinder Singh, Joseph Michael Swenton, Gilbert Vandling |
2016-07-26 |