Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11592482 | Scan channel slicing for compression-mode testing of scan chains | Anil Malik, Bharath Nandakumar | 2023-02-28 |
| 10996270 | System and method for multiple device diagnostics and failure grouping | Joe Swenton, Anil Malik, Krishna Vijaya Chakravadhanula | 2021-05-04 |
| 10853100 | Systems and methods for creating learning-based personalized user interfaces | Sonam Kathpalia, Mehakpreet Kaur, Krishna Vijaya Chakravadhanula | 2020-12-01 |
| 10338137 | Highly accurate defect identification and prioritization of fault locations | Anil Malik, Sharjinder Singh, Joseph Michael Swenton | 2019-07-02 |
| 10325048 | Virtual directory navigation and debugging across multiple test configurations in the same session | Sonam Kathpalia, Mehakpreet Kaur, James Allen, Krishna Vijaya Chakravadhanula | 2019-06-18 |
| 10180457 | System and method performing scan chain diagnosis of an electronic design | Sharjinder Singh, Anil Malik, Joseph Michael Swenton | 2019-01-15 |
| 10060976 | Method and apparatus for automatic diagnosis of mis-compares | Sharjinder Singh, Robert Jordan Asher, Sonam Kathpalia, Patrick Gallagher, Joseph Michael Swenton | 2018-08-28 |
| 9864004 | System and method for diagnosing failure locations in electronic circuits | Brion Keller, Joseph Michael Swenton, Sharjinder Singh, Anil Malik | 2018-01-09 |
| 9400311 | Method and system of collective failure diagnosis for multiple electronic circuits | Anil Malik, Sharjinder Singh, Joseph Michael Swenton, Gilbert Vandling | 2016-07-26 |