Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11592482 | Scan channel slicing for compression-mode testing of scan chains | Sameer Chakravarthy Chillarige, Bharath Nandakumar | 2023-02-28 |
| 10996270 | System and method for multiple device diagnostics and failure grouping | Sameer Chakravarthy Chillarige, Joe Swenton, Krishna Vijaya Chakravadhanula | 2021-05-04 |
| 10338137 | Highly accurate defect identification and prioritization of fault locations | Sameer Chakravarthy Chillarige, Sharjinder Singh, Joseph Michael Swenton | 2019-07-02 |
| 10180457 | System and method performing scan chain diagnosis of an electronic design | Sameer Chakravarthy Chillarige, Sharjinder Singh, Joseph Michael Swenton | 2019-01-15 |
| 9864004 | System and method for diagnosing failure locations in electronic circuits | Sameer Chakravarthy Chillarige, Brion Keller, Joseph Michael Swenton, Sharjinder Singh | 2018-01-09 |
| 9400311 | Method and system of collective failure diagnosis for multiple electronic circuits | Sameer Chakravarthy Chillarige, Sharjinder Singh, Joseph Michael Swenton, Gilbert Vandling | 2016-07-26 |