Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11892501 | Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patterns | Arvind Chokhani, Joseph Michael Swenton | 2024-02-06 |
| 11893336 | Utilizing transition ATPG test patterns to detect multicycle faults and/or defects in an IC chip | Arvind Chokhani, Joseph Michael Swenton | 2024-02-06 |
| 11740284 | Diagnosing multicycle faults and/or defects with single cycle ATPG test patterns | Arvind Chokhani, Joseph Michael Swenton | 2023-08-29 |
| 11579194 | Utilizing single cycle ATPG test patterns to detect multicycle cell-aware defects | Arvind Chokhani, Joseph Michael Swenton | 2023-02-14 |