Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10436837 | Auto test grouping/clock sequencing for at-speed test | Hardik Bhagat, Baalaji Konda Ramamoorthy, Douglas E. Sprague, Greeshma Jayakumar | 2019-10-08 |
| 8538718 | Clock edge grouping for at-speed test | Gary D. Grise, Vikram Iyengar, Douglas E. Sprague | 2013-09-17 |
| 7779375 | Design structure for shutting off data capture across asynchronous clock domains during at-speed testing | Gary D. Grise, Vikram Iyengar | 2010-08-17 |
| 7734968 | Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit) | Richard J. Grupp, Kelly A. Ockunzzi | 2010-06-08 |
| 7721170 | Apparatus and method for selectively implementing launch off scan capability in at speed testing | Gary D. Grise, Vikram Iyengar, David E. Lackey | 2010-05-18 |
| 7685542 | Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing | Gary D. Grise, Vikram Iyengar | 2010-03-23 |
| 7659740 | System and method of digitally testing an analog driver circuit | Joseph O. Marsh, Jeremy K. Stephens, Charlie C. Hwang, James S. Mason, Huihao Xu +2 more | 2010-02-09 |
| 7497876 | Prosthetic implant | Michael Antony Tuke, Andrew Clive Taylor, Peter Thomsen | 2009-03-03 |
| 7466156 | System of digitally testing an analog driver circuit | Joseph O. Marsh, Jeremy K. Stephens, Charlie C. Hwang, James S. Mason, Huihao Xu +2 more | 2008-12-16 |
| 7308630 | Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit) | Richard J. Grupp, Kelly A. Ockunzzi | 2007-12-11 |
| 7240266 | Clock control circuit for test that facilitates an at speed structural test | Henry R. Farmer, Gary D. Grise, David W. Milton | 2007-07-03 |
| 6882159 | Associated grouping of embedded cores for manufacturing test | Bruce Cowan, Kelly A. Ockunzzi, Jessica H. Pratt | 2005-04-19 |
| 6804803 | Method for testing integrated logic circuits | Carl Barnhart, Robert W. Bassett, Brion Keller, David E. Lackey, Donald L. Wheater | 2004-10-12 |
| 6016646 | Adjustable, resilent twine guide finger for twine wrap mechanism of large round baler | Roger William Frimml, Henry D. Anstey | 2000-01-25 |
| 5519975 | Drainage roofing tile | Laura B. Taylor | 1996-05-28 |
| 5248930 | Wheel wall electrostatic generator | — | 1993-09-28 |