MT

Mark R. Taylor

IBM: 11 patents #9,995 of 70,183Top 15%
FL Finsbury (Development) Limited: 1 patents #8 of 15Top 55%
Globalfoundries: 1 patents #2,221 of 4,424Top 55%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
JD John Deere: 1 patents #2,957 of 5,518Top 55%
Overall (All Time): #299,984 of 4,157,543Top 8%
16
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10436837 Auto test grouping/clock sequencing for at-speed test Hardik Bhagat, Baalaji Konda Ramamoorthy, Douglas E. Sprague, Greeshma Jayakumar 2019-10-08
8538718 Clock edge grouping for at-speed test Gary D. Grise, Vikram Iyengar, Douglas E. Sprague 2013-09-17
7779375 Design structure for shutting off data capture across asynchronous clock domains during at-speed testing Gary D. Grise, Vikram Iyengar 2010-08-17
7734968 Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit) Richard J. Grupp, Kelly A. Ockunzzi 2010-06-08
7721170 Apparatus and method for selectively implementing launch off scan capability in at speed testing Gary D. Grise, Vikram Iyengar, David E. Lackey 2010-05-18
7685542 Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing Gary D. Grise, Vikram Iyengar 2010-03-23
7659740 System and method of digitally testing an analog driver circuit Joseph O. Marsh, Jeremy K. Stephens, Charlie C. Hwang, James S. Mason, Huihao Xu +2 more 2010-02-09
7497876 Prosthetic implant Michael Antony Tuke, Andrew Clive Taylor, Peter Thomsen 2009-03-03
7466156 System of digitally testing an analog driver circuit Joseph O. Marsh, Jeremy K. Stephens, Charlie C. Hwang, James S. Mason, Huihao Xu +2 more 2008-12-16
7308630 Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit) Richard J. Grupp, Kelly A. Ockunzzi 2007-12-11
7240266 Clock control circuit for test that facilitates an at speed structural test Henry R. Farmer, Gary D. Grise, David W. Milton 2007-07-03
6882159 Associated grouping of embedded cores for manufacturing test Bruce Cowan, Kelly A. Ockunzzi, Jessica H. Pratt 2005-04-19
6804803 Method for testing integrated logic circuits Carl Barnhart, Robert W. Bassett, Brion Keller, David E. Lackey, Donald L. Wheater 2004-10-12
6016646 Adjustable, resilent twine guide finger for twine wrap mechanism of large round baler Roger William Frimml, Henry D. Anstey 2000-01-25
5519975 Drainage roofing tile Laura B. Taylor 1996-05-28
5248930 Wheel wall electrostatic generator 1993-09-28