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Clock edge grouping for at-speed test |
Vikram Iyengar, Douglas E. Sprague, Mark R. Taylor |
2013-09-17 |
| 8423847 |
Microcontroller for logic built-in self test (LBIST) |
David E. Lackey, Steven F. Oakland, Donald L. Wheater |
2013-04-16 |
| 8205124 |
Microcontroller for logic built-in self test (LBIST) |
David E. Lackey, Steven F. Oakland, Donald L. Wheater |
2012-06-19 |
| 7996807 |
Integrated test waveform generator (TWG) and customer waveform generator (CWG), design structure and method |
Vikram Iyengar, David E. Lackey, David W. Milton |
2011-08-09 |
| 7856607 |
System and method for generating at-speed structural tests to improve process and environmental parameter space coverage |
Peter A. Habitz, Vikram Iyengar, David E. Lackey, Chandramouli Visweswariah, Vladimir Zolotov |
2010-12-21 |
| 7840864 |
Functional frequency testing of integrated circuits |
Steven F. Oakland, Anthony D. Polson, Philip Stevens |
2010-11-23 |
| 7840863 |
Functional frequency testing of integrated circuits |
Steven F. Oakland, Anthony D. Polson, Philip Stevens |
2010-11-23 |
| 7793176 |
Method of increasing path coverage in transition test generation |
David J. Hathaway, Vikram Iyengar |
2010-09-07 |
| 7784000 |
Identifying sequential functional paths for IC testing methods and system |
Vikram Iyengar |
2010-08-24 |
| 7779375 |
Design structure for shutting off data capture across asynchronous clock domains during at-speed testing |
Vikram Iyengar, Mark R. Taylor |
2010-08-17 |
| 7721170 |
Apparatus and method for selectively implementing launch off scan capability in at speed testing |
Vikram Iyengar, David E. Lackey, Mark R. Taylor |
2010-05-18 |
| 7698611 |
Functional frequency testing of integrated circuits |
Steven F. Oakland, Anthony S. Polson, Philip Stevens |
2010-04-13 |
| 7685542 |
Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing |
Vikram Iyengar, Mark R. Taylor |
2010-03-23 |
| 7620921 |
IC chip at-functional-speed testing with process coverage evaluation |
Eric A. Foreman, Peter A. Habitz, Vikram Iyengar, David E. Lackey, Chandramouli Visweswariah +2 more |
2009-11-17 |
| 7529294 |
Testing of multiple asynchronous logic domains |
Vikram Iyengar, David E. Lackey |
2009-05-05 |
| 7490280 |
Microcontroller for logic built-in self test (LBIST) |
David E. Lackey, Steven F. Oakland, Donald L. Wheater |
2009-02-10 |
| 7290191 |
Functional frequency testing of integrated circuits |
Steven F. Oakland, Anthony D. Polson, Philip Stevens |
2007-10-30 |
| 7240266 |
Clock control circuit for test that facilitates an at speed structural test |
Henry R. Farmer, David W. Milton, Mark R. Taylor |
2007-07-03 |
| 6025992 |
Integrated heat exchanger for memory module |
Richard Dodge, Kenneth Haskell Earl, Douglas R. Guild, Karl D. Loughner, Jerzy M. Zalesinski |
2000-02-15 |
| 5663806 |
Non-destructive target marking for image stitching |
Jerzy M. Zalesinski |
1997-09-02 |
| 4870470 |
Non-volatile memory cell having Si rich silicon nitride charge trapping layer |
Roy Bass, Arup Bhattacharyya |
1989-09-26 |
| 4446535 |
Non-inverting non-volatile dynamic RAM cell |
Donald P. Gaffney, Chung H. Lam |
1984-05-01 |
| 4375085 |
Dense electrically alterable read only memory |
Ning Hsieh, Howard L. Kalter, Chung H. Lam |
1983-02-22 |
