Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit)

Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit)

US Patent 7734968 · Granted Jun 8, 2010

Estimated economic value: $3,517,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Auto test grouping/clock sequencing for at-speed test2019
Bypass structure for a memory device and method to reduce unknown test values2014
Clock edge grouping for at-speed test2013
Design structure for shutting off data capture across asynchronous clock domains2010
Apparatus and method for selectively implementing launch off scan capability in 2010
Method and apparatus for shutting off data capture across asynchronous clock dom2010
System and method of digitally testing an analog driver circuit2010
Prosthetic implant2009
System of digitally testing an analog driver circuit2008
Mechanism to provide test access to third-party macro circuits embedded in an AS2007
Mechanism to provide test access to third-party macro circuits embedded in an AS2007
Mechanism to provide test access to third-party macro circuits embedded in an AS2007