Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10436837 | Auto test grouping/clock sequencing for at-speed test | Mark R. Taylor, Baalaji Konda Ramamoorthy, Douglas E. Sprague, Greeshma Jayakumar | 2019-10-08 |
| 9057765 | Scan compression ratio based on fault density | Baalaji Ramamoorthy Konda | 2015-06-16 |