| 11485992 |
Screening and culture method |
Kevin Andrew Taylor |
2022-11-01 |
| 8035200 |
Neutralization of trapped charge in a charge accumulation layer of a semiconductor structure |
Ethan H. Cannon, Alvin W. Strong |
2011-10-11 |
| 7943482 |
Method for semiconductor device having radiation hardened insulators and design structure thereof |
Ethan H. Cannon |
2011-05-17 |
| 7935609 |
Method for fabricating semiconductor device having radiation hardened insulators |
Ethan H. Cannon |
2011-05-03 |
| 7880158 |
Phase-change TaN resistor based triple-state/multi-state read only memory |
Fen Chen, Kai D. Feng |
2011-02-01 |
| 7791169 |
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors |
Ethan H. Cannon, Philip J. Oldiges, Alvin W. Strong |
2010-09-07 |
| 7736915 |
Method for neutralizing trapped charge in a charge accumulation layer of a semiconductor structure |
Ethan H. Cannon, Alvin W. Strong |
2010-06-15 |
| 7715248 |
Phase-change TaN resistor based triple-state/multi-state read only memory |
Fen Chen, Kai D. Feng |
2010-05-11 |
| 7601602 |
Trench type buried on-chip precision programmable resistor |
Fen Chen, Timothy D. Sullivan |
2009-10-13 |
| 7388274 |
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors |
Ethan H. Cannon, Philip J. Oldiges, Alvin W. Strong |
2008-06-17 |
| 7381981 |
Phase-change TaN resistor based triple-state/multi-state read only memory |
Fen Chen, Kai D. Feng |
2008-06-03 |
| 7315075 |
Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors |
Ethan H. Cannon, Philip J. Oldiges, Alvin W. Strong |
2008-01-01 |
| 7084483 |
Trench type buried on-chip precision programmable resistor |
Fen Chen, Timothy D. Sullivan |
2006-08-01 |
| 7064414 |
Heater for annealing trapped charge in a semiconductor device |
Ethan H. Cannon, Philip J. Oldiges, Alvin W. Strong |
2006-06-20 |
| 6352902 |
Process of forming a capacitor on a substrate |
Alvin W. Strong |
2002-03-05 |
| 6333239 |
Processes for reduced topography capacitors |
Alvin W. Strong |
2001-12-25 |
| 6252275 |
Silicon-on-insulator non-volatile random access memory device |
Steven W. Mittl, Alvin W. Strong |
2001-06-26 |
| 6159787 |
Structures and processes for reduced topography trench capacitors |
Alvin W. Strong |
2000-12-12 |
| 6088258 |
Structures for reduced topography capacitors |
Alvin W. Strong |
2000-07-11 |
| 5530290 |
Large scale IC personalization method employing air dielectric structure for extended conductor |
Klaus D. Beyer, Billy L. Crowder, Stephen E. Greco |
1996-06-25 |
| 5444015 |
Larce scale IC personalization method employing air dielectric structure for extended conductors |
Klaus D. Beyer, Billy L. Crowder, Stephen E. Greco |
1995-08-22 |
| 5363550 |
Method of Fabricating a micro-coaxial wiring structure |
Shahzad Akbar, Billy L. Crowder, Asif Iqbal, Perwaiz Nihal |
1994-11-15 |
| 5268324 |
Modified silicon CMOS process having selectively deposited Si/SiGe FETS |
Vijay P. Kesan, Seshadri Subbanna, Manu J. Tejwani, Subramanian S. Iyer |
1993-12-07 |
