JL

Jim Shih-Chun Liang

Globalfoundries: 12 patents #298 of 4,424Top 7%
IBM: 7 patents #14,640 of 70,183Top 25%
📍 Poughkeepsie, NY: #216 of 1,613 inventorsTop 15%
🗺 New York: #7,406 of 115,490 inventorsTop 7%
Overall (All Time): #234,679 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDate
11688680 MIM capacitor structures Baozhen Li, Chih-Chao Yang 2023-06-27
11437312 High performance metal insulator metal capacitor Naftali E. Lustig, Atsushi Ogino, Nan Jing 2022-09-06
11257750 E-fuse co-processed with MIM capacitor Baozhen Li, Chih-Chao Yang, Ernest Y. Wu 2022-02-22
11244850 On integrated circuit (IC) device simultaneously formed capacitor and resistor Baozhen Li, Chih-Chao Yang 2022-02-08
11145591 Integrated circuit (IC) device integral capacitor and anti-fuse Baozhen Li, Chih-Chao Yang 2021-10-12
11101213 EFuse structure with multiple links Baozhen Li, Chih-Chao Yang, Tian Shen 2021-08-24
10998263 Back end of line (BEOL) time dependent dielectric breakdown (TDDB) mitigation within a vertical interconnect access (VIA) level of an integrated circuit (IC) device Naftali E. Lustig, Baozhen Li, Ning Lu 2021-05-04
10741497 Contact and interconnect structures 2020-08-11
10490501 Method to form interconnect structure with tungsten fill Keith Kwong Hon Wong 2019-11-26
10403574 Method to reduce resistance for a copper (Cu) interconnect landing on multilayered metal contacts, and semiconductor structures formed therefrom Atsushi Ogino, Justin C. Long 2019-09-03
10354918 Contact element structure of a semiconductor device 2019-07-16
10347529 Interconnect structures Keith Kwong Hon Wong 2019-07-09
10249534 Method of forming a contact element of a semiconductor device and contact element structure 2019-04-02
9991202 Method to reduce resistance for a copper (CU) interconnect landing on multilayered metal contacts, and semiconductor structures formed therefrom Justin C. Long, Atsushi Ogino 2018-06-05
9793216 Fabrication of IC structure with metal plug Joyeeta Nag, Domingo A. Ferrer Luppi, Atsushi Ogino, Andrew H. Simon, Michael P. Chudzik 2017-10-17
9633946 Seamless metallization contacts Domingo A. Ferrer, Kathryn T. Schonenberg, Shahrukh Khan, Wei-Tsu Tseng 2017-04-25
9589912 Integrated circuit structure with crack stop and method of forming same Atsushi Ogino, Stephen E. Greco, Roger QUON 2017-03-07
9589911 Integrated circuit structure with metal crack stop and methods of forming same Atsushi Ogino, Roger QUON, Stephen E. Greco 2017-03-07
9293365 Hardmask removal for copper interconnects with tungsten contacts by chemical mechanical polishing Domingo A. Ferrer, Joyeeta Nag, Wei-Tsu Tseng, George S. Tulevski 2016-03-22