Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Shawn A. Adderly — 15 Patents

IBM: 10 patents #10,925 of 70,183Top 20%
Globalfoundries: 5 patents #673 of 4,424Top 20%
South Burlington, VT: #151 of 1,136 inventorsTop 15%
Vermont: #507 of 4,968 inventorsTop 15%
Overall (All Time): #307,048 of 4,157,543Top 8%
15 Patents All Time
Shawn A. Adderly has been granted 15 US patents while listed as an inventor at IBM. The first was granted in 2015 and the most recent in March 2020. Shawn A. Adderly ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Shawn A. Adderly in South Burlington, VT, US.

Patents per Year

Patents granted per year, 2015 to 2020Bar chart with a peak of 4 patents in 2015.peak 42015: 4 patents20152016: 3 patents20162017: 4 patents20172018: 2 patents20182019: 1 patents20192020: 1 patents2020

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10607899 Nano deposition and ablation for the repair and fabrication of integrated circuits Jeffrey P. Gambino, Eric A. Joseph, Anthony C. Speranza 2020-03-31 $1,667,000
10224225 Centering substrates on a chuck Samantha D. DiStefano, Jeffrey P. Gambino, Max G. Levy, Max L. Lifson, Matthew D. Moon +1 more 2019-03-05 $2,050,000
10078183 Waveguide structures used in phonotics chip packaging Samantha D. DiStefano, Jeffrey P. Gambino, Prakash Periasamy, Donald R. Letourneau 2018-09-18 $23,108,000
9997385 Centering substrates on a chuck Samantha D. DiStefano, Jeffrey P. Gambino, Max G. Levy, Max L. Lifson, Matthew D. Moon +1 more 2018-06-12 $1,886,000
9685362 Apparatus and method for centering substrates on a chuck Samantha D. DiStefano, Jeffrey P. Gambino, Max G. Levy, Max L. Lifson, Matthew D. Moon +1 more 2017-06-20 $2,315,000
9583401 Nano deposition and ablation for the repair and fabrication of integrated circuits Jeffrey P. Gambino, Eric A. Joseph, Anthony C. Speranza 2017-02-28 $2,397,000
9576863 Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness Kyle Babinski, Daniel A. Delibac, David A. DeMuynck, Shawn R. Goddard, Matthew D. Moon +2 more 2017-02-21 $2,827,000
9543219 Void monitoring device for measurement of wafer temperature variations Samantha D. DiStefano, Mark Esposito, Jeffrey P. Gambino, Prakash Periasamy 2017-01-10 $8,696,000
9508578 Method and apparatus for detecting foreign material on a chuck Samantha D. DiStefano, Jeffrey P. Gambino, Max G. Levy, Max L. Lifson, Jed H. Rankin +1 more 2016-11-29 $4,439,000
9330988 Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness Kyle Babinski, Daniel A. Delibac, David A. DeMuynck, Shawn R. Goddard, Matthew D. Moon +2 more 2016-05-03 $3,695,000
9275868 Uniform roughness on backside of a wafer Jeffrey P. Gambino, Max L. Lifson, Matthew D. Moon, William J. Murphy, Timothy D. Sullivan +1 more 2016-03-01 $579,000
9201806 Anticipatorily loading a page of memory Paul Niekrewicz, Aydin Suren, Sebastian T. Ventrone 2015-12-01 $5,130,000
9196519 Achieving uniform capacitance between an electrostatic chuck and a semiconductor wafer Jeffrey P. Gambino, William J. Murphy, Jonathan D. Chapple-Sokol 2015-11-24 $992,000
9087839 Semiconductor structures with metal lines Daniel A. Delibac, Zhong-Xiang He, Matthew D. Moon, Anthony C. Speranza, Timothy D. Sullivan +2 more 2015-07-21 $2,242,000
9006703 Method for reducing lateral extrusion formed in semiconductor structures and semiconductor structures formed thereof Brian M. Czabaj, Daniel A. Delibac, Jeffrey P. Gambino, Matthew D. Moon, David C. Thomas 2015-04-14 $3,567,000