Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9576863 | Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness | Shawn A. Adderly, Kyle Babinski, Daniel A. Delibac, David A. DeMuynck, Matthew D. Moon +2 more | 2017-02-21 |
| 9330988 | Method of fine-tuning process controls during integrated circuit chip manufacturing based on substrate backside roughness | Shawn A. Adderly, Kyle Babinski, Daniel A. Delibac, David A. DeMuynck, Matthew D. Moon +2 more | 2016-05-03 |
| 7627622 | System and method of curve fitting | Edward W. Conrad, James C. Douglas, John S. Smyth | 2009-12-01 |