Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7660888 | Indicating network resource availability methods, system and program product | William Wagner | 2010-02-09 |
| 7627622 | System and method of curve fitting | Edward W. Conrad, James C. Douglas, Shawn R. Goddard | 2009-12-01 |
| 6965808 | System and method for optimizing metrology sampling in APC applications | Edward W. Conrad, Craig E. Schneider, Daniel Sullivan | 2005-11-15 |
| 6922600 | System and method for optimizing manufacturing processes using real time partitioned process capability analysis | Edward W. Conrad, Craig E. Schneider, Daniel Sullivan | 2005-07-26 |
| 6735492 | Feedback method utilizing lithographic exposure field dimensions to predict process tool overlay settings | Edward W. Conrad, Charles A. Whiting, David A. Ziemer | 2004-05-11 |
| 6557163 | Method of photolithographic critical dimension control by using reticle measurements in a control algorithm | Jed H. Rankin, Craig E. Schneider, Andrew J. Watts | 2003-04-29 |