Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9165917 | In-line stacking of transistors for soft error rate hardening | Ethan H. Cannon, K. Paul Muller, Alicia Wang | 2015-10-20 |
| 9075106 | Detecting chip alterations with light emission | Kerry Bernstein, James A. Culp, Dirk Pfeiffer, Anthony D. Polson, Peilin Song +2 more | 2015-07-07 |
| 8362600 | Method and structure to reduce soft error rate susceptibility in semiconductor structures | Cyril Cabral, Jr., Michael S. Gordon, Conal E. Murray, Kenneth P. Rodbell, Henry Tang | 2013-01-29 |
| 7791330 | On-chip jitter measurement circuit | Keith A. Jenkins | 2010-09-07 |
| 7480882 | Measuring and predicting VLSI chip reliability and failure | Peilin Song, Franco Motika, Franco Stellari | 2009-01-20 |
| 7439724 | On-chip jitter measurement circuit | Keith A. Jenkins | 2008-10-21 |
| 7084660 | System and method for accelerated detection of transient particle induced soft error rates in integrated circuits | Theodore H. Zabel, Richard B. Bhend, Naoko Pia Sanda, Scott Barnett Swaney, Jerry D. Ackaret | 2006-08-01 |
| 6230290 | Method of self programmed built in self test | Wei Hwang, Toshiaki Kirihata | 2001-05-08 |
| 6172512 | Image processing methods for the optical detection of dynamic errors in integrated circuits | Richard J. Evans, Jeffrey A. Kash, Daniel R. Knebel, James C. Tsang | 2001-01-09 |
| 6108798 | Self programmed built in self test | Wei Hwang, Toshiaki Kirihata | 2000-08-22 |