Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7084660 | System and method for accelerated detection of transient particle induced soft error rates in integrated circuits | Theodore H. Zabel, David F. Heidel, Naoko Pia Sanda, Scott Barnett Swaney, Jerry D. Ackaret | 2006-08-01 |
| 4591727 | Solid state scanner for a variable speed transport | Georg Gaebelein, deceased, Robert D. Keillor, Jeffrey L. Lovgren, John R. Mercer | 1986-05-27 |