Issued Patents All Time
Showing 1–25 of 230 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12283312 | Short circuit detection in a read/write assist capacitor of a memory | Noam Jungmann, Elazar Kachir, Bishan He, Rajiv V. Joshi, Baozhen Li +2 more | 2025-04-22 |
| 12218120 | Device mismatch mitigation for medium range and beyond distances | Matthew S. Angyal, Noah Zamdmer, Varadarajan Vidya, James D. Strom, Grant P. Kesselring +1 more | 2025-02-04 |
| 11960830 | Exploratory data interface | Jonathan Fry, Cheng Luo, Cheng-Yi Lin, Jang Sim | 2024-04-16 |
| 11308257 | Stacked via rivets in chip hotspots | David Wolpert, Atsushi Ogino, Matthew T. Guzowski, Steven P. Ostrander, Tuhin Sinha +1 more | 2022-04-19 |
| 11303285 | Multi-mode design and operation for transistor mismatch immunity | James D. Strom, Erik Unterborn, Michael A. Sperling, Grant P. Kesselring | 2022-04-12 |
| 10839133 | Circuit layout similarity metric for semiconductor testsite coverage | Rasit Onur Topaloglu, Werner Rausch, Leon Stok | 2020-11-17 |
| 10628544 | Optimizing integrated circuit designs based on interactions between multiple integration design rules | Jason D. Hibbeler, Dongbing Shao, Steven Zebertavage | 2020-04-21 |
| 10614190 | Deep trench floorplan distribution design methodology for semiconductor manufacturing | Frank Malgioglio | 2020-04-07 |
| 10592627 | Optimizing integrated circuit designs based on interactions between multiple integration design rules | Jason D. Hibbeler, Dongbing Shao, Steven Zebertavage | 2020-03-17 |
| 9754071 | Integrated circuit (IC) design analysis and feature extraction | Haraprasad Nanjundappa, Basanth Jagannathan, Laura S. Chadwick, Christopher V. Baiocco | 2017-09-05 |
| 9646124 | Modeling transistor performance considering non-uniform local layout effects | Richard Q. Williams | 2017-05-09 |
| 9536039 | Optical proximity correction (OPC) accounting for critical dimension (CD) variation from inter-level effects | Shayak Banerjee, Dongbing Shao | 2017-01-03 |
| 9401424 | High performance stress-enhanced MOSFETs using Si:C and SiGe epitaxial source/drain and method of manufacture | Huajie Chen, Omer H. Dokumaci | 2016-07-26 |
| 9342648 | Optical proximity correction (OPC) accounting for critical dimension (CD) variation from inter-level effects | Shayak Banerjee, Dongbing Shao | 2016-05-17 |
| 9311443 | Correcting for stress induced pattern shifts in semiconductor manufacturing | James A. Culp, Paul C. Parries, Ian P. Stobert | 2016-04-12 |
| 9305999 | Stress-generating structure for semiconductor-on-insulator devices | Huilong Zhu, Brian J. Greene, Gregory G. Freeman | 2016-04-05 |
| 9082877 | Complementary metal oxide semiconductor (CMOS) device having gate structures connected by a metal gate conductor | Yue Liang, Brian J. Greene, William K. Henson, Unoh Kwon, Shreesh Narasimha +1 more | 2015-07-14 |
| 9059316 | Structure and method for mobility enhanced MOSFETs with unalloyed silicide | Yaocheng Liu, Oleg Gluschenkov, Judson R. Holt, Renee T. Mo, Kern Rim | 2015-06-16 |
| 9040373 | Silicon device on SI:C-OI and SGOI and method of manufacture | Omer H. Dokumaci, Oleg Gluschenkov | 2015-05-26 |
| 9023698 | High performance stress-enhanced MOSFETs using Si:C and SiGe epitaxial source/drain and method of manufacture | Huajie Chen, Omer H. Dokumaci | 2015-05-05 |
| 8993395 | Minimizing leakage current and junction capacitance in CMOS transistors by utilizing dielectric spacers | Ramachandran Muralidhar, Philip J. Oldiges, Viorel Ontalus | 2015-03-31 |
| 8997028 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta | 2015-03-31 |
| 8969104 | Circuit technique to electrically characterize block mask shifts | Emrah Acar, Aditya Bansal, Liang Pang, Amith Singhee | 2015-03-03 |
| 8901566 | High performance stress-enhanced MOSFETs using Si:C and SiGe epitaxial source/drain and method of manufacture | Huajie Chen, Omer H. Dokumaci | 2014-12-02 |
| 8871576 | Silicon nanotube MOSFET | Daniel Tekleab, Hung H. Tran, Jeffrey W. Sleight | 2014-10-28 |