Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8997028 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Dureseti Chidambarrao, Jason D. Hibbeler, Anda C. Mocuta | 2015-03-31 |
| 8429576 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Dureseti Chidambarrao, Jason D. Hibbeler, Anda C. Mocuta | 2013-04-23 |
| 8418087 | Analyzing multiple induced systematic and statistical layout dependent effects on circuit performance | Shayak Banerjee, Dureseti Chidambarrao, James A. Culp, Saibal Mukhopadhyay | 2013-04-09 |
| 8239790 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Dureseti Chidambarrao, Jason D. Hibbeler, Anda C. Mocuta | 2012-08-07 |
| 8176444 | Analyzing multiple induced systematic and statistical layout dependent effects on circuit performance | Shayak Banerjee, Dureseti Chidambarrao, James A. Culp, Saibal Mukhopadhyay | 2012-05-08 |
| 8103983 | Electrically-driven optical proximity correction to compensate for non-optical effects | Kanak B. Agarwal, Shayak Banerjee, Lars Liebmann | 2012-01-24 |
| 8042070 | Methods and system for analysis and management of parametric yield | James A. Culp, Paul Chang, Dureseti Chidambarrao, Jason D. Hibbeler, Anda C. Mocuta | 2011-10-18 |
| 7865864 | Electrically driven optical proximity correction | Shayak Banerjee, James A. Culp, Lars Liebmann | 2011-01-04 |