Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10288583 | Defect discrimination apparatus, methods, and systems | Luis Emilio San Martin, Reza Khalaj Amineh, Aixa Maria Rivera-Rios | 2019-05-14 |
| 8997028 | Methods and system for analysis and management of parametric yield | James A. Culp, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta | 2015-03-31 |
| 8429576 | Methods and system for analysis and management of parametric yield | James A. Culp, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta | 2013-04-23 |
| 8239790 | Methods and system for analysis and management of parametric yield | James A. Culp, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta | 2012-08-07 |
| 8042070 | Methods and system for analysis and management of parametric yield | James A. Culp, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta | 2011-10-18 |